A Study on Fatigue Behavior at Pre-Crack Tip under Mixed-Mode Single Overloading (In the Case of Using the C-Scan Method)

Abstract:

Article Preview

Info:

Periodical:

Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee

Pages:

1171-1176

DOI:

10.4028/www.scientific.net/KEM.270-273.1171

Citation:

S. H. Song and J. M. Lee, "A Study on Fatigue Behavior at Pre-Crack Tip under Mixed-Mode Single Overloading (In the Case of Using the C-Scan Method)", Key Engineering Materials, Vols. 270-273, pp. 1171-1176, 2004

Online since:

August 2004

Export:

Price:

$35.00

In order to see related information, you need to Login.