Identification of Stress-Free State and Mapping of Residual Stress Fields by Laser Interferemetry

Dong Won Kim; Nak Kyu Lee; Kyoung Hoan Na; Dong Il Kwon

doi:10.4028/www.scientific.net/KEM.270-273.1682

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Identification of Stress-Free State and Mapping of Residual Stress Fields by Laser Interferemetry
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Identification of Stress-Free State and Mapping of Residual Stress Fields by Laser Interferemetry

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Key Engineering Materials (Volumes 270-273)

Pages:

1682-1687

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.270-273.1682

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Online since:

August 2004

Authors:

Dong Won Kim, Nak Kyu Lee, Kyoung Hoan Na, Dong Il Kwon

Keywords:

Mapping, Nondestructive Testing (NDT), Residual Stress Field, Speckle Interferometry, Stress Relaxation, Thermoelasticity

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