Comments on Probabilistic Fracture Mechanics Analysis of Cracked Components

Nam Su Huh; Do Jun Shim; Yun Jae Kim; Kyu Ho Lee; Young Jin Kim

doi:10.4028/www.scientific.net/KEM.270-273.1755

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Detection of Micro-Delamination in Electronic Packaging by Using the Ultrasonic Nonlinearity
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Comments on Probabilistic Fracture Mechanics Analysis of Cracked Components

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Key Engineering Materials (Volumes 270-273)

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1755-1760

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https://doi.org/10.4028/www.scientific.net/KEM.270-273.1755

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Online since:

August 2004

Authors:

Nam Su Huh, Do Jun Shim, Yun Jae Kim, Kyu Ho Lee, Young Jin Kim

Keywords:

First-Order Reliability Method (FORM), Leak-Before-Break (LBB), Monte-Carlo, Probabilistic Fracture Mechanics, Reference Stress

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