Applications of a Capacitive Probe to Detect Defects on Dielectric Materials

Young Joo Kim; Joo Gwang Lee; Bong Young Ahn; Seung Seok Lee

doi:10.4028/www.scientific.net/KEM.270-273.606

Paper Titles

Preparation of Eddy Current Impedance Plane Diagram by Finite Element Modeling
p.579

Time-Domain and Frequency-Domain Eddy Current Simulations by the Finite Element Method
p.585

Rapid Reconstruction of Natural Stress Corrosion Cracking from Eddy Current NDT Data
p.593

Development of an ECT Technique for Discriminating between a Through-Wall/Non Through-Wall Crack in a Steam Generator Tube
p.600

Applications of a Capacitive Probe to Detect Defects on Dielectric Materials
p.606

Long-Distance Inspection of Pipes Using Electromagnetic Acoustic Transducer for Cylindrical Wave
p.612

Flaw Detection of Railroad Wheel Tread Using EMAT
p.619

The Detection of Defects in Paramagnetic Materials Using Locally Focused Electromagnetic Field Technique
p.625

Numerical Consideration of Magnetic Camera for Quantitative Nondestructive Evaluation
p.630

HomeKey Engineering MaterialsKey Engineering Materials Vols. 270-273Applications of a Capacitive Probe to Detect...

Applications of a Capacitive Probe to Detect Defects on Dielectric Materials

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Periodical:

Key Engineering Materials (Volumes 270-273)

Pages:

606-611

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.270-273.606

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Online since:

August 2004

Authors:

Young Joo Kim, Joo Gwang Lee, Bong Young Ahn, Seung Seok Lee

Keywords:

BEM, Capacitive Probes, Dielectric Material, Nondestructive Testing (NDT)

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References

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