Applications of a Capacitive Probe to Detect Defects on Dielectric Materials

Abstract:

Article Preview

Info:

Periodical:

Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee

Pages:

606-611

Citation:

Y. J. Kim et al., "Applications of a Capacitive Probe to Detect Defects on Dielectric Materials", Key Engineering Materials, Vols. 270-273, pp. 606-611, 2004

Online since:

August 2004

Export:

Price:

$38.00

[1] P.J. Shull, J.C. Moulder, P.R. Heyliger, M. gimple, and B.A. Auld: Review of Progress in Quantitative NDE (1988) 7A, p.517.

[2] M. Gimple, B.A. Auld : Res. Nondestr. Eval. (1989), p.111.

[3] K. Tewary, P. R. Heyliger and A.V. Clark: J. of Mater. Res., Vol. 6, No. 3(1991), p.629.

[4] Nabors and J. White, FastCap: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Vol. 10, No. 11(1991), p.1447.

DOI: https://doi.org/10.1109/43.97624

Fetching data from Crossref.
This may take some time to load.