Applications of a Capacitive Probe to Detect Defects on Dielectric Materials

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Periodical:

Key Engineering Materials (Volumes 270-273)

Edited by:

Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee

Pages:

606-611

DOI:

10.4028/www.scientific.net/KEM.270-273.606

Citation:

Y. J. Kim et al., "Applications of a Capacitive Probe to Detect Defects on Dielectric Materials", Key Engineering Materials, Vols. 270-273, pp. 606-611, 2004

Online since:

August 2004

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Price:

$35.00

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