Damage Evaluation of Subsurface Defect in Sandwich by Phase-Shifting Digital Shearography

Article Preview

Abstract:

When a sandwich structure is loaded in uniaxial in-plane compression the skin over the debonded region may buckle allowing further propagation of the debond, leading to structural collapse. Hence how to detect the shape and size of debonded defect, and to trace propagation trend of the defect are key factor in the process of damage evaluation of subsurface defect. In the paper, a nondestructive testing system is developed based on liquid crystal cell and Wollaston shearing prism. Nematic liquid crystal has the property of modulating the intensity and phase of light, and the intensity will not change during the phase modulating. According to this property, the phase-shifting of digital shearography are performed successfully. The experimental results prove that we can not only perform detection of the defect size and shape in subsurface of sandwich structure, but also trace the further propagation of debonded defect because of local buckle. This indicates that the method of digital shearogrephy will offer an effective measurement tool to research the buckle behavior of debond defect in subsurface of sandwich under uniaxial in-plane compression.

You might also be interested in these eBooks

Info:

Periodical:

Key Engineering Materials (Volumes 306-308)

Pages:

399-404

Citation:

Online since:

March 2006

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2006 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Petras A., Sutcliffe M., Failure mode maps for honeycomb sandwich panels, Composite Structures, 1999, 44, 237-252.

DOI: 10.1016/s0263-8223(98)00123-8

Google Scholar

[2] Hwang S.F., Liu G.H., Buckling behavior of composite laminates with muitiple delamination under uniaxial compression, Composite Structures, 2001, 53, 235-243.

DOI: 10.1016/s0263-8223(01)00007-1

Google Scholar

[3] Hung Y.Y., Applications of digital shearography for testing of composite structures, Composites Part B: Engineering, 1997, 30(3-4), 765-773.

DOI: 10.1016/s1359-8368(99)00027-x

Google Scholar

[4] Chen J.L., Qin Y.W., Ji H.W., and Ji X.H., Novel quantitative non-destructive testing method for composite structures, Optics and Lasers in Engineering, 1998, 30(3-4), 299-304.

DOI: 10.1016/s0143-8166(98)00020-7

Google Scholar

[5] Chen J.L., Sun C.G., Qin Y.W., Ji X.H., Digital shearing speckle for nondestructive testing of composite materials, Journal of Astronautics,2004, 25(3), 323-326.

Google Scholar

[6] Qian K.M., Miao H., Wu X.P., A real-time polarization phase shifting technique for dynamic measurement, ACTA OPTICA SINICA, 2001, 21 (1), 64-67.

Google Scholar

[7] Chen J.L., Qin Y.W., and Ji X.H., Phase-shifting shearing speckle for quantitative NDT of bimaterials interface, ACTA Materiae Compositae SINICA, 2001, 18 (1), 128-130.

Google Scholar

[8] Soden R.A.J., Dewhurst R.J., An integrated liquid crystal phase modulator for speckle shearing interferometry, Optics and Laser in Eng., 1999, 31 (2-3), 123-134.

DOI: 10.1016/s0143-8166(99)00004-4

Google Scholar

[9] Jiang Lijun, Liu Wei, Tan Yushan, A study on PALC phase-shifting shearing ESSPI, Acta Optic Sinica, 1996, 16(10), 244-247.

Google Scholar

[10] Chen J.L., Hung Y.Y., Study on the phase-shifting large shearing speckle pattern interferometry based on the liquid crystal, Acta Optic Sinica,2004, 24(9), 1292-1296.

Google Scholar

[11] Udupa G., Ngoi B., Goh H.C. and Yusoff M.N., Defect detection in unpolished Si wafers by digital shearography, Measurement Science and Technology, 2004, 15(1), 35-43.

DOI: 10.1088/0957-0233/15/1/005

Google Scholar