Development of Piezo-Spectroscopic Techniques for Nano-Scale Stress Analysis in the Scanning Electron Microscope of Zirconia Bioceramics Based on Rare-Earth Fluorescence

Abstract:

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The electro-stimulated luminescence spectrum of a rare-earth ion added to zirconia (ZrO2) lattice was investigated with the aim of using it as a sensor for nano-scale stress (fluorescence piezo-spectroscopy) and phase transformation assessments in a field emission scanning electron microscope (FE-SEM). In this paper, the selected rare-earth fluorescent ion Eu, added to ZrO2 as a raw oxide powder (Eu2O3) before sintering (in the amount of 1.0 wt. %). Spectroscopic results indicated that the spectral shift of some fluorescent band of the selected rare-earth ion was sensitive to residual stress and that the electron-stimulated spectra of Eu2O3-doped ZrO2 in its tetragonal and monoclinic polymorphs were different to each other. Based on these findings, the luminescent substance can be useful as a “stress and phase transformation sensor”, in order to clarify the elementary mechanisms behind synthetic ZrO2.

Info:

Periodical:

Key Engineering Materials (Volumes 309-311)

Main Theme:

Edited by:

Takashi Nakamura, Kimihiro Yamashita and Masashi Neo

Pages:

1215-1218

DOI:

10.4028/www.scientific.net/KEM.309-311.1215

Citation:

K. Yamada et al., "Development of Piezo-Spectroscopic Techniques for Nano-Scale Stress Analysis in the Scanning Electron Microscope of Zirconia Bioceramics Based on Rare-Earth Fluorescence ", Key Engineering Materials, Vols. 309-311, pp. 1215-1218, 2006

Online since:

May 2006

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$35.00

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