A Simple Method for Evaluating Flaw Distributions Responsible for Size Effects in the Strength of Small-Scale Silicon Specimens

Abstract:

A simple means of deconvoluting the size distributions of fracture-controlling flaws from Weibull strength plots for small-scale specimens is proposed. The method makes use a power-law distribution function, empirical in form but self-consistent with a conventional two-parameter Weibull probability distribution. Literature data for single-crystal silicon beam specimens covering a range of widths from mm to nm are analyzed according to this procedure. The analysis indicates a reduction in scatter in addition to increase in strength with diminishing specimen size, and quantifies a systematic tightening in flaw distribution associated with refinement in fabrication method.

• Periodical: Key Engineering Materials (Volume 312)
• Pages: 77-82
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.312.77
• Online since: June 2006
• Authors: Kai Duan, Xiao Zhi Hu
• Keywords: Flaw Size, Silicon, Small-Scale Specimens, Strength, Weibull Distribution

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