A Simple Method for Evaluating Flaw Distributions Responsible for Size Effects in the Strength of Small-Scale Silicon Specimens

Abstract:

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A simple means of deconvoluting the size distributions of fracture-controlling flaws from Weibull strength plots for small-scale specimens is proposed. The method makes use a power-law distribution function, empirical in form but self-consistent with a conventional two-parameter Weibull probability distribution. Literature data for single-crystal silicon beam specimens covering a range of widths from mm to nm are analyzed according to this procedure. The analysis indicates a reduction in scatter in addition to increase in strength with diminishing specimen size, and quantifies a systematic tightening in flaw distribution associated with refinement in fabrication method.

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Periodical:

Edited by:

Hong-Yuan Liu, Xiaozhi Hu and Mark Hoffman

Pages:

77-82

DOI:

10.4028/www.scientific.net/KEM.312.77

Citation:

K. Duan and X. Z. Hu, "A Simple Method for Evaluating Flaw Distributions Responsible for Size Effects in the Strength of Small-Scale Silicon Specimens", Key Engineering Materials, Vol. 312, pp. 77-82, 2006

Online since:

June 2006

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$35.00

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