The Surface Valence Band Structure and Hemocompatibility of Rutile Titanium Oxide Films

Abstract:

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Rutile titanium oxide films were fabricated by reactive unbalanced magnetron sputtering. The blood compatibility is evaluated in vitro by clotting time and platelet adhesion measurement. The surface valence band electronic structure is gained by the XPS valence band spectra. The rutile titanium oxide films exhibit attractive hemocompatibility. The result of the valence band electronic structure of the films on the surface indicated that the rutile titanium oxide film represent an n-type semiconductor characteristics and the characters result in the prevention of the charge transfering between the blood and materials and overall excellent antithrombogenic properties.

Info:

Periodical:

Key Engineering Materials (Volumes 330-332)

Main Theme:

Edited by:

Xingdong Zhang, Xudong Li, Hongsong Fan, Xuanyong Liu

Pages:

605-608

DOI:

10.4028/www.scientific.net/KEM.330-332.605

Citation:

L. X. Xu et al., "The Surface Valence Band Structure and Hemocompatibility of Rutile Titanium Oxide Films", Key Engineering Materials, Vols. 330-332, pp. 605-608, 2007

Online since:

February 2007

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Price:

$35.00

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