High Frequency Dielectric Permittivity Measurement of Dielectric Layer of MLCC Using Non-Contact Probe

Hirofumi Kakemoto; Jianyong Li; Takakiyo Harigai; Song Min Nam; Satoshi Wada; Takaaki Tsurumi

doi:10.4028/www.scientific.net/KEM.350.243

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High Frequency Dielectric Permittivity Measurement of Dielectric Layer of MLCC Using Non-Contact Probe
p.243

HomeKey Engineering MaterialsKey Engineering Materials Vol. 350High Frequency Dielectric Permittivity Measurement...

High Frequency Dielectric Permittivity Measurement of Dielectric Layer of MLCC Using Non-Contact Probe

Abstract:

Direct observations for high frequency microscopic dielectric distributions in cross sections of a multi-layer ceramic capacitor were carried out using non-contact type microwave probe. The measured data were imaged from the raw data and rounding data process. Using microwave reflection intensity mappings from cross sections of multi-layer ceramic capacitor, the dielectric permittivity distribution in micro-region of a multi-layer ceramic capacitor was measured at room temperature. The spatial resolution was experimentally estimated to be about 10 μm from mappings of the dielectric and inner electrode layers in a multi-layer ceramic capacitor.

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Periodical:

Key Engineering Materials (Volume 350)

Pages:

243-246

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.350.243

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Online since:

October 2007

Authors:

Hirofumi Kakemoto, Jianyong Li, Takakiyo Harigai, Song Min Nam, Satoshi Wada, Takaaki Tsurumi

Keywords:

High-Frequency, Mapping, Multilayer Ceramic Capacitor (MLCC), Reflection Intensity, Spatial Resolution

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