Measurement of Indentation Fracture Toughness of Silicon Nitride Ceramics: II, Effect of the Experimental Conditions

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The influence of two measuring conditions, the elapsed time after indentation and the condition of edge of an indenter, on the indentation fracture toughness of silicon nitrides was assessed. No slow crack-growth after unloading was confirmed by optical microscopic observation of a crack tip induced by the indentation, which led to the negligible difference in fracture toughness measured at 1 and 30 min after the indentation. Measurements with relatively new and used indenters gave almost the same fracture toughness data, indicating that the crack lengths were hardly affected by the slight damage of the corner of the indenter. It was suggested that the large scattering of the indentation fracture toughness reported by the round-robin tests such as VAMAS was not originated from these factors.

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Periodical:

Edited by:

Katsutoshi Komeya, Yohtaro Matsuo and Takashi Goto

Pages:

45-48

Citation:

H. Miyazaki et al., "Measurement of Indentation Fracture Toughness of Silicon Nitride Ceramics: II, Effect of the Experimental Conditions", Key Engineering Materials, Vol. 352, pp. 45-48, 2007

Online since:

August 2007

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$38.00

[1] B.R. Lawn, A.G. Evans and D.B. Marshall: J. Am. Ceram. Soc. Vol. 64 (1981), p.539.

[2] H. Awaji, T. Yamada and H. Okuda: J. Ceram. Soc. Jpn. Vol. 99 (1991), p.417.

[3] Report of preliminary investigation for standardization of fine ceramics, Japanese Fine Ceramics Association (1998).

[4] C.B. Ponton and R.D. Rawlings: Mater. Sci. Tech. Vol. 5 (1989), p.961.

[5] T. Miyoshi, N. Sagawa and T. Sasa: J. Jpn. Soc. Mech. Eng. A Vo. 51 (1985), p.2489.

[6] K. Niihara, R. Morena and D.P.H. Hasselman: J. Mater. Sci. Lett. Vol. 1 (1982), p.13.

[7] K.D. McHenry, T. Yonushonis and R.E. Tressler: J. Am. Ceram. Soc. Vol. 59 (1976), p.262.

[8] A. Bhatnagar, M.J. Hoffman and R.H. Dauskardt: J. Am. Ceram. Soc. Vol. 83 (2000), p.585 Fig. 3 SEM micrographs of the corner of the indenter. (a): relatively new indenter and (b): used one. (a) (b) 2µm 2µm.

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