Analysis of a Thin Electrode Layer between Two Dissimilar Piezoelectric Solids

Hyeon Gyu Beom; Y.H. Kim; C. Cho; Chang Boo Kim

doi:10.4028/www.scientific.net/KEM.353-358.1568

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Effects of Particle Distribution on the Residual Thermal Stresses of (W,Ti)C/SiC/Al₂O₃ Ceramic Composite
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Bi-Axial Flexure Strength, Weibull Modulus and Fracture Mode of Alumina Glass-Infiltrated Core/Veneer Ceramic Composites
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Fabrication and Microstructure of SrBi₂Ta₂O₉ Ceramic
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Mechanical Properties of ZrB₂-Based Ceramics Reinforced by Nano-SiC Whiskers
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Analysis of a Thin Electrode Layer between Two Dissimilar Piezoelectric Solids
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Effect of Sintering Process on Fabrication of Porous Si₃N₄/SiC Composites
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Microhardness and Machinability of Fluorphlogopite-Mullite Glass-Ceramics
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Tribology of Titanium Boride Sliding against Silicon Carbide at Elevated Temperatures
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The Group Velocity Change in the Unidirectional Composite Materials
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 353-358Analysis of a Thin Electrode Layer between Two...

Analysis of a Thin Electrode Layer between Two Dissimilar Piezoelectric Solids

Abstract:

A thin electrode layer at the interface between two dissimilar linear piezoelectric materials under electromechanical loading is investigated. The complex function theory is employed to obtain the exact solution to a finite thin conductive layer. Special consideration is devoted to the structure of singular stress and electric fields near the tip of the thin electrode between two dissimilar piezoelectric materials. The stress and electric field are found to have an inverse square root singularity. The electric field intensity factor characterizes uniquely the singular fields close to the edge of the conductive line sheet.