Preparation and Characterization of the Ordered SiO2 Colloidal Crystallization Films

Shuan Gui Qing; Bo Liu; Xun Liang; Hai Yang Li; Wei Zhong Lv; Hong Hua Cai; Fang Wang; Zhong Kuang Luo

doi:10.4028/www.scientific.net/KEM.368-372.1389

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 368-372Preparation and Characterization of the Ordered...

Preparation and Characterization of the Ordered SiO₂ Colloidal Crystallization Films

Abstract:

Multilayer SiO2 crystals modified by alkoxysilanes were fabricated by the vertical deposition technique combined with self-assembly method. The SiO2 colloidal crystallization was prepared by the traditional Stöber-Fink-Bohn method, and modified by different alkoxysilanes to investigate the properties of the films. The films fabricated by the ordering of SiO2 spheres were investigated by infrared spectrometer, X-ray diffraction, scanning electron microscope, UV-visible spectrophotometer. The results showed that thin film is the face-centered cubic structures and the spheres are [111]-oriented.