Research on Quantum State in Fabricating Poly-Si Films

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Abstract:

Amorphous silicon films prepared by PECVD on glass substrate have been crystallized by rapid thermal annealing (RTA). By means of micro-Raman scattering and scanning electronic microscope (SEM), the quantum states in these processions are found and discussed.

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Periodical:

Key Engineering Materials (Volumes 428-429)

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540-543

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January 2010

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© 2010 Trans Tech Publications Ltd. All Rights Reserved

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