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Research on Quantum State in Fabricating Poly-Si Films
Abstract:
Amorphous silicon films prepared by PECVD on glass substrate have been crystallized by rapid thermal annealing (RTA). By means of micro-Raman scattering and scanning electronic microscope (SEM), the quantum states in these processions are found and discussed.
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Pages:
540-543
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Online since:
January 2010
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© 2010 Trans Tech Publications Ltd. All Rights Reserved
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