Simulation Research on Elastic Constant and Natural Frequency of NCD Coated AFM Probes

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Abstract:

In this work, the elastic constant and natural frequency of NCD and non-NCD coated AFM probes were simulated using ANSYS. The results indicated that after depositing 1~2μm thick NCD films on the silicon probes, the elastic constant and natural frequency were both increased, yet within the prescribed limit: when the cantilevers had the same total thicknesses (3μm, 3.5μm and 4μm), the elastic constant and the natural frequency of the NCD coated probes were increased by 96%~107% and 28%~30% respectively, compared with the silicon probes.

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Periodical:

Key Engineering Materials (Volumes 431-432)

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491-494

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Online since:

March 2010

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© 2010 Trans Tech Publications Ltd. All Rights Reserved

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