Evolution of Internal Stress and Influence on Dielectric Properties by Number of Dielectric Layers in MLCC

Satoshi Yokomizo; Takuya Hoshina; Hiroaki Takeda; Katsuya Taniguchi; Youichi Mizuno; Hirokazu Chazono; Osamu Sakurai; Takaaki Tsurumi

doi:10.4028/www.scientific.net/KEM.445.31

Paper Titles

Fabrication and Microstructure of Grain-Oriented (Bi_1/2K_1/2)TiO₃ Ceramics
p.15

Effect of Al₂O₃ Additives in PZT-Pb(Mn_1/3Nb_2/3)O₃ Ceramics
p.19

Crystal Structure Analysis of High T_C Barium Titanate – Bismuth Perovskite-Type Oxide System Ceramics and their Piezoelectric Property
p.23

Dielectric Properties of Barium Titanate Ceramics with Nano-Sized Domain
p.27

Evolution of Internal Stress and Influence on Dielectric Properties by Number of Dielectric Layers in MLCC
p.31

Degradation of Resistance over Time for Multilayer Ceramic Capacitors
p.35

Analysis of Oxygen Vacancy Trapping at [001] Symmetric Tilt Grain Boundaries in Barium Titanate by Atomistic Simulations
p.39

Improvement of Compact X-Rays Source Using Uniaxially Polarized LiNbO₃ Single Crystal
p.43

Nonlinear Shear Response in (K,Na)NbO₃-Based Lead-Free Piezoelectric Ceramics
p.47

HomeKey Engineering MaterialsKey Engineering Materials Vol. 445Evolution of Internal Stress and Influence on...

Evolution of Internal Stress and Influence on Dielectric Properties by Number of Dielectric Layers in MLCC

Abstract:

We researched the phenomenon that the permittivity of dielectric layers in multilayer ceramic capacitor (MLCC) increases with the number of dielectric layers. Finite element method (FEM) shows that the internal residual stress in MLCC was generated by the difference of thermal expansion coefficient between internal electrodes and dielectric layers. We developed a electric measurement system with applying external stress for understanding the stress influence on dielectric properties. The compressive stress along electric field increased the polarization. The polar nano regions (PNRs) in shell composition dielectrics were easily influenced by stress. Based on these results, the relationship between the number of dielectric layers and their permittivity in MLCCs was explained.