[1]
T. Takenaka and K. Sakata: Ferroelectrics 95 (1989) p.153.
Google Scholar
[2]
T. Takenaka, K. Sakata and K. Toda: Ferroelectrics 106 (1990) p.375.
Google Scholar
[3]
T. Takenaka, K. Murayama and K. Sakata: Jpn. J. Appl. Phys. 30 (1991) p.2236.
Google Scholar
[4]
H. Nagata, M. Yoshida, Y. Makiuchi and T. Takenaka: Jpn. J. Appl. Phys. 42 (2003) p.7401.
Google Scholar
[5]
A. Sasaki, T. Chiba, Y. Mamiya and E. Otsuki: Jpn. J. Appl. Phys. 38 (1999) p.5564.
Google Scholar
[6]
Y. R. Zhang, J. F. Li, B. P. Zhang, and C. E. Peng: J. Appl. Phys. 103 (2008) 074109.
Google Scholar
[7]
K. Yoshii, Y. Hiruma, H. Nagata and T. Takenaka: Jpn. J. Appl. Phys. 45 (2006) p.4493.
Google Scholar
[8]
J. F. Carroll ΙΙΙ, D. A. Payne, Y. Noguchi and M. Miyayama: IEEE Trans. Ultrason. Ferroelectr. Freq. Contrrol 54. (2007) p.2516.
Google Scholar
[9]
M. Izumi, K. Yamamoto, M. Suzuki, Y. Noguchi and M. Miyayama: Appl. Phys. Lett. 93 (2008) 242903.
Google Scholar
[10]
Y. Hosono, K. Harada, and Y. Yamashita: Jpn. J. Appl. Phys. 40 (2001) p.5722.
Google Scholar
[11]
S. A. Sheets, A. N. Soukhojak, N. Ohashi, and Y. M. Chiang: J. Appl. Phys. 90 (2001) p.5287.
Google Scholar
[12]
J. Suchanicz: J. Phys. Chem. Solids 62 (2001) p.1271.
Google Scholar
[13]
Y. Noguchi, T. Matsumoto and M. Miyayama: Jpn. J. Appl. Phys. 44 (2005) L570.
Google Scholar
[14]
K. Yamamoto, Y. Kitanaka, M. Suzuki, M. Miyayama, Y. Noguchi, C. Moriyoshi and Y. Kuroiwa: Appl. Phys. Lett. 91 (2007) 162909.
DOI: 10.1063/1.2800822
Google Scholar
[15]
Y. Noguchi, M. Soga, M. Takahashi and M. Miyayama: Jpn. J. Appl. Phys. 44 (2005) p.6998.
Google Scholar
[16]
M. Dawber and J. F. Scott: Appl. Phys. Lett. 76 (2000) p.1060.
Google Scholar
[17]
L. He and D. Vamderbilt: Phys. Rev. B. 68 (2003) 134103.
Google Scholar