Preparation and Characterization of La0.8Sr0.2Ga0.8Mg0.2O3-δ Film by Electrophoretic Deposition Method

Abstract:

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La0.8Sr0.2Ga0.8Mg0.2O3-δ (LSGM) precursor particles were successfully prepared by ultrasonic spray pyrolysis. LSGM thin films were prepared by the electrophoretic deposition (EPD) technique using ethanol containing iodine. The LSGM films were obtained by sintering at 1300 °C for 10 h. The X-ray diffraction patterns revealed that the diffraction peak of LSGM thin films was in agreement with the perovskite structure. The LSGM films attained a uniform thickness of 10 μm.

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Periodical:

Edited by:

Shinobu Fujihara and Tadashi Takenaka

Pages:

86-90

DOI:

10.4028/www.scientific.net/KEM.445.86

Citation:

A. Toriyama et al., "Preparation and Characterization of La0.8Sr0.2Ga0.8Mg0.2O3-δ Film by Electrophoretic Deposition Method", Key Engineering Materials, Vol. 445, pp. 86-90, 2010

Online since:

July 2010

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$35.00

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