Study on the Luminescence and Reflection Spectra of Al2O3 Doped Er2O3 Films on Si Substrates

Yan Yan Zhu; Ze Bo Fang; Yu Zhao; Hui Yu Li; Jing Chen; Hai Jing Cao

doi:10.4028/www.scientific.net/KEM.474-476.345

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 474-476Study on the Luminescence and Reflection Spectra...

Study on the Luminescence and Reflection Spectra of Al₂O₃ Doped Er₂O₃ Films on Si Substrates

Abstract:

Amorphous Al₂O₃ doped Er₂O₃ films were deposited on Si(001) substrates by radio frequency magnetron sputtering technique. Emission spectra exhibit a strong emission band around 410 nm and a series of emission band near 970, 980, 1018, 1042 and 1080nm. Ellipsometry measurements show that the refractive index of the ErAlO films in the region of 400～1000 nm is between 1.76-1.83. The reflectivity of the ErAlO on Si is much smaller than that of clean Si and pure Er₂O₃ films. All the results indicate that ErAlO could be a promising material for Si solar cells.

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Key Engineering Materials (Volumes 474-476)

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345-348

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https://doi.org/10.4028/www.scientific.net/KEM.474-476.345

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April 2011

Authors:

Yan Yan Zhu, Ze Bo Fang, Yu Zhao, Hui Yu Li, Jing Chen, Hai Jing Cao

Keywords:

Optical Property, Rare Earth Oxide, Solar Power

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