Comparison of Picosecond and Femtosecond Laser Ablation for Surface Engraving of Metals and Semiconductors

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Pico and femtosecond lasers present a growing interest for industrials applications such as surface structuring [1] or thin film selective ablation [2]. Indeed, they combine the unique capacity to process any type of material (dielectrics, semiconductors, metals) with an outstanding precision and a reduced affected zone. We report on results about surface engraving of metals (Al, Cu, Mo, Ni), semiconductor (Si) and polymer (PC) using a picosecond thin disk Yb:YAG-amplifier. The pulse duration of this source can be changed using two different configurations: direct amplification of a 34ps-oscillator on one hand, and 1ps-chirped pulse amplification (CPA) scheme on the other hand. The results obtained with this thin disk laser are compared to ones achieved with two commercial femtosecond lasers respectively based on Yb-doped crystals and fibers, and operating at similar output power levels (up to 15Watt).

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61-66

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December 2011

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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[1] J. Koenig and T. Bauer, Proceedings of SPIE / Photonics West conference, 7925, 101-106 (2011).

Google Scholar

[2] A. Schoonderbeek, V. Schütz, O. Haupt and U. Stute, Proceeding of the 11th International Symposium on Laser Precision Microfabrication (2010).

Google Scholar

[3] C. Momma et al. : Short-pulse laser ablation of solid targets, Opt. Com., 129, 134-142 (1996).

Google Scholar

[4] J. Lopez, C. Loumena, Y. Zaouter and E. Mottay, Proceeding of the 11th International Symposium on Laser Precision Microfabrication (2010).

Google Scholar

[5] J. Lopez, C. Loumena, V. Archambault, Y. Zaouter, A. Trisorio, M. Faucon and E. Mottay: Proceedings of the International Congress on Applications of Lasers & Electro-Optics (ICALEO), 102, 976-984 (2009).

DOI: 10.2351/1.5061675

Google Scholar

[6] A. Ancona, S. Döring, C. Jauregui, F. Röser, J. Limpert, S. Nolte, and A. Tünnermann, Opt. Lett. 34, 3304-3306 (2009).

DOI: 10.1364/ol.34.003304

Google Scholar

[7] M. Schmid, B. Neuenschwander, V. Romano, B. Jaeggi and U. Hunziker, Proceedings of SPIE / Photonics West conference, 7920, 091-097 (2011).

Google Scholar

[8] B. Jaeggi, B. Neuenschwander, M. Schmid, M. Muralt, J. Zuercher and U. Hunziker, Proceeding of the 6th International WLT conference on Lasers in Manufacturing (LiM), Physics Procedia, 12, 164-171 (2011).

DOI: 10.1016/j.phpro.2011.03.118

Google Scholar