Accelerated Degradation Modeling and Statistical Analysis of MEMS Device Based on Competing Failure

Qing Xia; Zong Jie Cao; Yuan Da Wang; Peng Sun

doi:10.4028/www.scientific.net/KEM.531-532.580

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 531-532Accelerated Degradation Modeling and Statistical...

Accelerated Degradation Modeling and Statistical Analysis of MEMS Device Based on Competing Failure

Abstract:

Traditional reliability analysis of MEMS devices is based on only one failure mode, but paroxysmal failure and degradation failure are simultaneous on one MEMS device which is called as competing failure modes. Accelerated degradation modeling and parameter estimation based on competing failure modes are elementary contents of reliability analysis, in which paroxysmal failure and degradation failure are integrated in the process of educing reliability function, and elementary theories of reliability and statistics are used. The method of accelerated degradation modeling and parameter estimation is proved to be precise in a simulation of accelerated life test on a kind of MEMS device which have the two failure modes: paroxysmal failure and degradation failure, and they are have relations with stress variable: current.

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Periodical:

Key Engineering Materials (Volumes 531-532)

Pages:

580-583

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.531-532.580

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Online since:

December 2012

Authors:

Qing Xia, Zong Jie Cao, Yuan Da Wang, Peng Sun

Keywords:

Competing Failure, Modeling, Parameter Estimation, Reliability

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References

[1] Y.Guangbin and Y.Kai: IEEE Transactions on Reliability, Vol.51 (2002) No. 4, p.463

Google Scholar

[2] M.X. Jiang and Y.C. Zhang: Reliability and Maintainability Symposium (New York, USA, January 28-31, 2002). p.607

Google Scholar

[3] A.M. Deng: Research on Reliability Technology of High-reliability and Long-lifetime Products (Ph.D., National University of Defense Technology .China 2006)(In Chinese)

Google Scholar