[1]
R.A. Wood, Uncooled thermal imaging with monolithic silicon focal plans, Poc. SPIE, vol. 2020, (1993) 322-329.
Google Scholar
[2]
Andrew C. Jones, Samuel Berweger, Jiang Wei, David Cobden, and Markus B. Raschke, Nano-optical investigations of the metal-insulator phase behavior of individual V02 microcrystais, Nano Letters 10, (2010) 1574-1581.
DOI: 10.1021/nl903765h
Google Scholar
[3]
J. Wei, Z. Wang, W, Chen, and D.H. Cobden, New aspects of the metal-insulator transition in single-domain vanadium dioxide nanobeams, Nature Nanotechnology 4, (2009) 420-424.
DOI: 10.1038/nnano.2009.141
Google Scholar
[4]
Nicholas Fieldhouse et al, Electrical properties of vanadium oxide thin films for bolometer applications: processed by pulse dc sputtering, J. Phys. D: Appl. Phys. (2009) 42 055408.
DOI: 10.1088/0022-3727/42/5/055408
Google Scholar
[5]
V. N. Ovsuk, et al., Uncooled matrix micro-bolometric IR detectors based on sol-gel VOx, Journal of Applied Physics (Russian), no. 6, (2005) 114-117.
Google Scholar
[6]
J.J. Yang, et al., Memristive switching mechanism for metal//oxide//metal nanodevices, Nat Nano, 3 (2008) 429-433.
Google Scholar
[7]
Y.V. Pershin and M. Di Ventra, Spin memristive systems: Spin memory effects in semiconductor spintronics. Physical Review B (Condensed Matter and Materials Physics), 78(11), (2008) 113309-4.
DOI: 10.1103/physrevb.78.159905
Google Scholar
[8]
H.W. Verleur, A.S. Barker, C.N. Berglund, Optical Properties of VO2 between 0.25 and 5 eV, Phys. Rev. 172, (1968) 788-798.
Google Scholar
[9]
F.J. Morin, Oxides Which Show a Metal-to-Insulator Transition at the Neel Temperature. Phys. Rev. Lett. 3, (1959) 34-36.
DOI: 10.1103/physrevlett.3.34
Google Scholar
[10]
F. Chudnovskiy, S. Luryi, & B. Spivak, in Future Trends in Microelectronics: The Nano Millennium (Wiley-IEEE Press), 2002.
Google Scholar
[11]
H. Jerominek, F. Picard, D. Vincent, Vanadium-Oxide Films for Optical Switching and Detection. Optical Engineering 32, (1993) 2092-2099.
DOI: 10.1117/12.143951
Google Scholar
[12]
S. N. Svitasheva, V. N. Kruchinin, Spectral dependence of the complex refractive index shift across the semiconductor-metal transition in thermally- oxidized Vanadium.- Thin Solid Films, 313-314, 319-322 (1998).
DOI: 10.1016/s0040-6090(97)00840-7
Google Scholar
[13]
B.S. Borisov, S.T. Koretskaya, V.G. Mokerov, A.V. Rakov, S.G. Solovjev, Electrical and Optical Properties of VO2 in semi-metal semiconductor transition, Solid State Physics (Russian), 12 (1970) 2209-2216.
Google Scholar
[14]
T.G. Lanskaya, R.I. Lubinskaya, S.N. Svitasheva, Ellipsometric study of thermal oxidation of Vanadium, Journal of Technical Physics (Russian), 51, (1981) 1920-1927.
Google Scholar