Large Scanning Range and Rapid AFM for Biological Cell Topography Imaging

Bo Hua Yin; Dai Xie Chen; Yun Sheng Lin; Ying Ying Gao; Han Li; Dong Han

doi:10.4028/www.scientific.net/KEM.562-565.697

Paper Titles

The Study in the Application of Nanotechnology Digital Printing in Clothing Pattern Design
p.674

A PDMS Micropump for Implantable Drug Delivery Application
p.680

Application of Electrical Resistance Tomography to Ice-Water Two-Phase Flow Parameters Measurement
p.686

Effect of pH on Hard Disk Substrate Polishing in Glycine-Hydrogen Peroxide System Abrasive-Free Slurry
p.691

Large Scanning Range and Rapid AFM for Biological Cell Topography Imaging
p.697

The Study of Correlations among Parameters in Electrohydrodynamics Micro-Jet Printing System
p.701

A Parallel Computing Dynamic Task Scheduling System for Nano-Materials Design and Simulation
p.709

The Preparation of Size-Controlled Antimony Nanoparticles by Electrochemical Method
p.716

Analytical Method for Calculating Curvature of Circular Silicon Wafer Caused by Boron Doping
p.721

HomeKey Engineering MaterialsKey Engineering Materials Vols. 562-565Large Scanning Range and Rapid AFM for Biological...

Large Scanning Range and Rapid AFM for Biological Cell Topography Imaging

Abstract:

The small spatial displacement of the piezo tube scanner limits the AFM(Atomic Force Microscopy) scanning range, especially when facing up to cell topography scanning. And the low dynamic property of normal AFM tube scanner tube restricts the imaging speed. In order to achieve large scanning range and rapid scanning motion simultaneously, a special atomic force microscopy is designed. The 100um scanning range is obtained by the new scanner which is composed of the flexure guide structure instead of peizo tube. Furthermore, a new acquiring image method is used to eliminating AFM nonlinearity error. Using this scanning system, some large biological cells are imaged in liquid environments with 30 lines per second.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Key Engineering Materials (Volumes 562-565)

Pages:

697-700

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.562-565.697

Citation:

Cite this paper

Online since:

July 2013

Authors:

Bo Hua Yin, Dai Xie Chen, Yun Sheng Lin, Ying Ying Gao, Han Li, Dong Han

Keywords:

AFM, Large Range Scanning, Rapid Scanning, Sinusoidal Driving

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] Toshio Ando, High-speed atomic force microscopy coming of age. Nanotechnology 23 (2012) 062001 (27pp)

DOI: 10.1088/0957-4484/23/6/062001

Google Scholar

[2] Toshio Ando, Noriyuki Kodera, et al. A high-speed atomic force microscope for studying biological macromolecules. PNAS, 2001 vol. 98 NO.22, p.12468–12472

DOI: 10.1073/pnas.211400898

Google Scholar

[3] BINNING G, ROHRER G. Atomic force microscope[J]. Physical Review Letters,1986, 56: 930-933

Google Scholar

[4] A. D. L. Humphris, M. J. Miles, and J. K. Hobbsb. A mechanical microscope: High-speed atomic force microscopy; APPLIED PHYSICS LETTERS 86, 034106 (2005)

DOI: 10.1063/1.1855407

Google Scholar

[5] Neal Crampton, Masatoshi Yokokawa, David T. F. Dryden, et al. Fast-scan atomic force microscopy reveals that the type III restriction enzyme EcoP15I is capable of DNA translocation and looping. PNAS, 2007, vol. 104, no. 31, p.12755–12760

DOI: 10.1073/pnas.0700483104

Google Scholar

[6] Toshio Ando, Takayuki Uchihashi Takeshi Fukuma. High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes. Progress in Surface Science 83 (2008) 337–437

DOI: 10.1016/j.progsurf.2008.09.001

Google Scholar

[7] Georg E. Fantner, Georg Schitter, Johannes H. Kindt; Components for high speed atomic force microscopy; Ultramicroscopy 106 (2006) 881–887

DOI: 10.1016/j.ultramic.2006.01.015

Google Scholar

[8] Andrew Humphris, Max McConnell and David Catto; A High-Speed Atomic Force Microscope Capable of Video-Rate Imaging. Microscopy and Analysis 20(2):S29-S31 (UK), (2006)

Google Scholar

[9] Georg Schitter, Philipp J. Thurner, Paul K. Hansma. Design and input-shaping control of a novel scanner for high-speed atomic force microscopy. Mechatronics 18 (2008), p.282–288

DOI: 10.1016/j.mechatronics.2008.02.007

Google Scholar

[10] YIN Bo-hua, CHEN Dai-xie, LIN Yun-sheng, CHU Ming-zhang, HAN Li . Design of AFM system with high speed and large scanning range. Optics and Precision Engineering, 2011, VOL.19, NO.11, P2651-2655.

DOI: 10.3788/ope.20111911.2651

Google Scholar