[1]
Directive 2002/95/EC, The Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment, The European Parliament and of the Council of the European Union, 2003. 27(1).
Google Scholar
[2]
K.S. Kim, S.H. Huh, K. Suganuma, Microelectro-n[J], Reliability, 2003, 43 (2): 259–267.
Google Scholar
[3]
Z.G. Chen, Y.W. Shi, Z.D. Xia, Y.F. Yan, Study on the microstructure of a novel lead-free solder alloy SnAgCu-RE and its soldered joints[J], J. Electron. Mater. 2002, 31 (10): 1122–1128.
DOI: 10.1007/s11664-002-0052-4
Google Scholar
[4]
Z.G. Chen, Y.W. Shi, Z.D. Xia, Y.F. Yan, Properties of lead-free solder SnAgCu containing minute amounts of rare earth[J] , J. Electron. Mater. 2003, 32 (4): 235–243.
DOI: 10.1007/s11664-003-0215-y
Google Scholar
[5]
Z.G. Chen, Y.W. Shi, Z.D. Xia, Constitutive. Relations on Creep for SnAgCuRE Lead-Free Solder Joints [J], J. Electron. Mater. 2004, 33 (9): 964–971.
DOI: 10.1007/s11664-004-0023-z
Google Scholar
[6]
B. Li, Y.W. Shi, Y.P. Lei, F. Guo, Z.D. Xia, B. Zong, Effect of praseodymium on the microstructure and properties of Sn3. 8Ag0. 7Cu solder[J], J. Electron. Mater. 2005, 34(3): 217–224.
Google Scholar
[7]
Z.D. Xia, Z.G. Chen, Y.W. Shi, N. Mu, N. Sun, Effect of rare earth element additions on the microstructure and mechanical properties of tin-silver-bismuth solder[J], J. Electron. Mater. 2002, 31 (6): 564–567.
DOI: 10.1007/s11664-002-0126-3
Google Scholar
[8]
D.Q. Yu, J. Zhao, L. Wang, Improvement on the microstructure stability, mechanical and wetting properties of Sn-Ag-Cu lead-free solder with the addition of rare element[J].J. Alloys Compd. 2004, 376 (1–2): 170–175.
DOI: 10.1016/j.jallcom.2004.01.012
Google Scholar
[9]
C.M.L. Wu, D.Q. Yu, C.M.T. Law, L. Wang, The properties of Sn-9Zn lead- free solder alloys doped with trace rare earth elements[J], Mater. Sci. Eng. 2004, R44 (1): 1–44.
DOI: 10.1007/s11664-002-0184-6
Google Scholar
[10]
JIS Z 3198-5, Test Methods for Lead-Free Solders, Part 5, Methods for Tensile Tests and Shear Tests on Solder Joints, Japanese Industrial Standards Committee, (2003).
Google Scholar
[11]
K. Zeng, K.N. Tu, SnPb solder reaction in flip chip technology [J], Mater. Sci. Eng. 2002, R38 (2): 55–105.
Google Scholar
[12]
W.M. Xiao, Y.W. Shi, Y.P. Lei, Z.D. Xia, F. Guo, Comparative study of microstructures and properties of three valuable SnAgCuRE lead-free solder alloys[J]. J. Elect. Mater. 2006, 35 (5): 1095–1103.
DOI: 10.1007/bf02692572
Google Scholar