HT-XRD Analysis of W Thick Coatings for Nuclear Fusion Technology

Article Preview

Abstract:

W is a promising material to use as protection for thermal shields in future nuclear fusion reactors, however the joining to other metals is really challenging. For realizing such joints plasma spraying (PS) has been used for its simplicity, the possibility to cover complex and extended surfaces and the relatively low cost. An appropriate interlayer must be optimized to increase the adhesion of W on the substrates and to provide a soft interface for better thermo-mechanical compatibility.The present work demonstrates that high-temperature X-ray diffraction (HT-XRD) permits to quickly assess the reliability and quality of the coating-interlayer-substrate system by measuring the strain of coating. This is very useful to orientate the work for optimizing the structure and composition of the interlayer and the parameters of deposition process.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

31-34

Citation:

Online since:

April 2014

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] H. Bolt, V. Barabash, W. Krauss, J. Linke, R. Neu, S. Suzuki, N. Nyoshida: J. Nucl. Mater. 329-333, 66 (2004).

Google Scholar

[2] B. Riccardi, R. Montanari, M. Casadei, G. Costanza, G. Filacchioni, A. Moriani: J. Nucl. Mater. 352 (2006), 29-35.

DOI: 10.1016/j.jnucmat.2006.02.069

Google Scholar

[3] R. Montanari, B. Riccardi, R. Volterri, L. Bertamini: Mater. Lett. 52, 11 (2002).

Google Scholar

[4] S. Kaciulis, A. Mezzi, R. Montanari, N. Ucciardello, R. Volterri, Surf. Interface Anal., 42/6-7 (2010), 1197-1200.

DOI: 10.1002/sia.3302

Google Scholar

[5] F. Casadei, R. Donnini, S. Lionetti, G. Maddaluno, R. Montanari, N. Ucciardello, Proc. of PFMC-13 – Rosenheim (Germany) 9-13 May 2011.

Google Scholar

[6] B.D. Cullity, Elements of X-ray diffraction, Second edition, Addison-Wesley Publishing Company INC., Reading Massachusetts, 1978, p.358.

Google Scholar

[7] T. Ganne , J. Crépin, S. Serror, A. Zaoui, Acta Materialia 50 (2002), 4149-4163.

DOI: 10.1016/s1359-6454(02)00256-2

Google Scholar

[8] Y. Yahiro, M. Mitsuhara, K. Tokunakga, N. Yoshida, T. Hirai, K. Ezato, S. Suzuki, M. Akiba, H. Nakashima, J. Nucl. Mater. 386-388 (2009), 784-788.

DOI: 10.1016/j.jnucmat.2008.12.219

Google Scholar

[9] E. Harry, A. Rouzaud, M. Ignat, P. Juliet, Thin Solid Films 332 (1998), 195-201.

DOI: 10.1016/s0040-6090(98)01056-6

Google Scholar