Analysis of the Surface Shape Effect on Optical Homogeneity Measurement of Large Calibre Optical Materials

Article Preview

Abstract:

Optical homogeneity is an important measurement of the optical materials, directly affects wavefront quality of the refractive optical system, changes the system wavefront aberration. As the traditional direct measurement method requires high precision surface shape machining for optical material (PV value < 0.1λ), it was gradually replaced by the method of Fizeau interferometer four step, which requires lower surface shape. This article used 600mm diameter Fizeau interferometer, a four step method tested the optical homogeneity of the same 500 mm diameter fused quartz material with a front surface shape respectively 3.719 λ and 0.427 λ (λ = 632.8nm). Comparison of the test results showed that the PV difference of optical homogeneity between the two was only 0.036 λ, △n inaccuracy was 10-7, and the homogeneity morphology matched exactly. To further analyze the factors affecting the optical homogeneity, the front surface shape of the other sample was sliced ​​in a predetermined direction. This artical analyzed the effect of morphology upon the slicing line on optical homogeneity. The conclusion was that the direct affecting factor on optical homogeneity was the slope of surface morphology, rather than the overall PV value.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

480-484

Citation:

Online since:

November 2014

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2015 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] H. Ren, J. Yuan, H. Xu, Optics & Optical Electronic Technology. 5 (2007) 48-51.

Google Scholar

[2] L. Zhao, Y. P. Lv, J. Yang, Infrared and Laser Engineering. 35(2006)98-105.

Google Scholar

[3] J. Lin. Journal of Applied Optics. 29(2008).

Google Scholar

[4] C. Ai, J. C. Wyant. Optical Engineering. 1991, 30(9)1399-1404.

Google Scholar

[5] J. Schwider, R. Buow, K. E. Elssner, Applide Optics. 1985, 24(18)3059-3061.

Google Scholar