Improvement of Magnetic Force Microscope Performance by Tuning the Coating Material of Sensor Tip

Abstract:

Article Preview

Effects of magnetic material, coating thickness, and tip radius on the magnetic force microscope (MFM) spatial resolution and the switching field have been investigated. MFM tips are prepared by coating soft and hard magnetic materials on non-magnetic Si-base tips. MFM spatial resolutions better than 8 nm are obtained by optimizing the coating layer thickness at around 20 nm on the Si tips with top radius of 3 – 5 nm. The switching field can be increased greater than 1 kOe by coating a high-Ku magnetic material and by increasing the coating thickness. The tips are successfully applied to the observations of magnetic thin films which include magnetization structures less than 20 nm in length.

Info:

Periodical:

Edited by:

J. Gutierez, J.M. Barandiarán, Evangelos Hristoforou and Dr. Dimitros S. Vlachos

Pages:

189-195

Citation:

M. Futamoto and M. Ohtake, "Improvement of Magnetic Force Microscope Performance by Tuning the Coating Material of Sensor Tip", Key Engineering Materials, Vol. 644, pp. 189-195, 2015

Online since:

May 2015

Export:

Price:

$38.00

* - Corresponding Author

[1] M. Futamoto, T. Hagami, S. Ishihara, K. Soneta, and M. Ohtake, IEEE Trans. Magn. vol. 49 (2013) p.2748–2754.

DOI: https://doi.org/10.1109/tmag.2013.2251868

[2] K. Nagano, K. Tobari, K. Soneta, M. Ohtake and M. Futamoto, J. Magn. Soc. Jpn. vol. 36 (2012) p.109–115.

[3] K. Soneta, M. Ohtake and M. Futamoto, J. Magn. Soc. Jpn. vol. 37 (2013) p.107–110.

[4] M. Ohtake, K. Soneta and M. Futamoto, J. Appl. Phys. vol. 111 (2012) pp. 07E339-1–07E339-3.

[5] T. Hagami, K. Soneta, M. Ohtake and M. Futamoto, EPJ Web Conf. vol. 40 (2013) pp.01002-1–01002-4.

[6] S. Ishihara, M. Ohtake and M. Futamoto, EPJ Web Conf. vol. 40 (2013) pp.08003-1–08003-4.

[7] S. Ishihara, T. Hagami, K. Soneta, M. Ohtake and M. Futamoto, J. Magn. Soc. Jpn. vol. 37 (2013) p.56–61.

[8] M. Ohtake, D. Suzuki, F. Kirino and M. Futamoto, IEICE Trans. Electron. vol. E96-C (2013) p.1460–1468.

[9] S. Ishihara, M. Ohtake and M. Futamoto, J. Magn. Soc. Jpn. vol. 37 (2013) p.255–258.

[10] M. Futamoto, T. Hagami, S. Ishihara, K. Soneta and M. Ohtake, Key Eng. Mater. vol. 543 (2013) p.35–38.

[11] R. Suzuki, S. Ishihara, M. Ohtake and M. Futamoto, Key Eng. Mater. vol. 605 (2014) p.465–469.