Improvement of Magnetic Force Microscope Performance by Tuning the Coating Material of Sensor Tip

Article Preview

Abstract:

Effects of magnetic material, coating thickness, and tip radius on the magnetic force microscope (MFM) spatial resolution and the switching field have been investigated. MFM tips are prepared by coating soft and hard magnetic materials on non-magnetic Si-base tips. MFM spatial resolutions better than 8 nm are obtained by optimizing the coating layer thickness at around 20 nm on the Si tips with top radius of 3 – 5 nm. The switching field can be increased greater than 1 kOe by coating a high-Ku magnetic material and by increasing the coating thickness. The tips are successfully applied to the observations of magnetic thin films which include magnetization structures less than 20 nm in length.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

189-195

Citation:

Online since:

May 2015

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2015 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] M. Futamoto, T. Hagami, S. Ishihara, K. Soneta, and M. Ohtake, IEEE Trans. Magn. vol. 49 (2013) p.2748–2754.

DOI: 10.1109/tmag.2013.2251868

Google Scholar

[2] K. Nagano, K. Tobari, K. Soneta, M. Ohtake and M. Futamoto, J. Magn. Soc. Jpn. vol. 36 (2012) p.109–115.

DOI: 10.3379/msjmag.1201r004

Google Scholar

[3] K. Soneta, M. Ohtake and M. Futamoto, J. Magn. Soc. Jpn. vol. 37 (2013) p.107–110.

Google Scholar

[4] M. Ohtake, K. Soneta and M. Futamoto, J. Appl. Phys. vol. 111 (2012) pp. 07E339-1–07E339-3.

Google Scholar

[5] T. Hagami, K. Soneta, M. Ohtake and M. Futamoto, EPJ Web Conf. vol. 40 (2013) pp.01002-1–01002-4.

DOI: 10.1051/epjconf/20134001002

Google Scholar

[6] S. Ishihara, M. Ohtake and M. Futamoto, EPJ Web Conf. vol. 40 (2013) pp.08003-1–08003-4.

Google Scholar

[7] S. Ishihara, T. Hagami, K. Soneta, M. Ohtake and M. Futamoto, J. Magn. Soc. Jpn. vol. 37 (2013) p.56–61.

Google Scholar

[8] M. Ohtake, D. Suzuki, F. Kirino and M. Futamoto, IEICE Trans. Electron. vol. E96-C (2013) p.1460–1468.

Google Scholar

[9] S. Ishihara, M. Ohtake and M. Futamoto, J. Magn. Soc. Jpn. vol. 37 (2013) p.255–258.

Google Scholar

[10] M. Futamoto, T. Hagami, S. Ishihara, K. Soneta and M. Ohtake, Key Eng. Mater. vol. 543 (2013) p.35–38.

DOI: 10.4028/www.scientific.net/kem.543.35

Google Scholar

[11] R. Suzuki, S. Ishihara, M. Ohtake and M. Futamoto, Key Eng. Mater. vol. 605 (2014) p.465–469.

Google Scholar