Anisotropic Elastic Properties of Chiral Sculptured Thin Films at Micro-Scale Evaluated by Resonance Frequency Spectra

Hui Fang; Kenta Matsumoto; Takashi Sumigawa; Takayuki Kitamura

doi:10.4028/www.scientific.net/KEM.645-646.9

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 645-646Anisotropic Elastic Properties of Chiral...

Anisotropic Elastic Properties of Chiral Sculptured Thin Films at Micro-Scale Evaluated by Resonance Frequency Spectra

Abstract:

Chiral sculptured thin films (STFs) Glancing-angle deposition (GLAD) thin films are nanoengineered to meet the requirements of a variety of applications such as micro filters, sensors, and waveguides due to their unique frequency characteristics which cannot be achieved by conventional solid materials. For the design, it is necessary to understand the elastic properties of STFs. To facilitate this, we report on our newly developed advanced micro-scale vibration testing process. In the testing, specially designed micro-specimens with surface areas of tens by tens of microns are excited using a piezoelectric (PZT) actuator and the resonance frequencies are detected by a laser device in the vertical or lateral directions successfully. The anisotropy elastic modulus of STFs composed of helical nanosprings are identified on the basis of vibration testing. The thin film shows strong characteristic anisotropy that the solid one hardly can attain. The micro-scale testing technique can be extended to other materials and microstructures.

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Periodical:

Key Engineering Materials (Volumes 645-646)

Pages:

9-14

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.645-646.9

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Online since:

May 2015

Authors:

Hui Fang*, Kenta Matsumoto, Takashi Sumigawa, Takayuki Kitamura

Keywords:

Chiral Sculptured Thin Films, Mechanical Anisotropy, Micro-Scale, Vibration Testing

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* - Corresponding Author

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