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Photoluminescence Probing the Si Incorporation in MBE Grown Al_XGa_1-XAs
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HomeKey Engineering MaterialsKey Engineering Materials Vol. 65Optical Characterization of Monolayer Islands and...

Optical Characterization of Monolayer Islands and Interface Effects in InGaAs/InP Multiquantum Well Structures

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Optical Characterization of Semiconductors

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Periodical:

Key Engineering Materials (Volume 65)

Pages:

87-92

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.65.87

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January 1992

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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