Patent Map Analysis of Measurement Technology

Peng Fei Huang; Chen Guang Wei; Rui Na Pan

doi:10.4028/www.scientific.net/KEM.680.60

Paper Titles

Semiquantitative Test Method for Degradation Ratio of Vacuum Degree of Vacuum Glazing by Photoelastic Method
p.44

Determination of Chloridion Content in the Cement by Ion Chromatograph
p.48

Determination of Cl^- in Concrete Materials by Ion Chromatography
p.52

A New Method for Studying the Damage in Concrete Subjected Single Face Salt Freezing Cycle
p.56

Patent Map Analysis of Measurement Technology
p.60

Study on the Methods for Measuring Closed Cell Content of Cellular Glass and its Thermal Insulation Performance
p.68

Finite Element Analysis of Head-Form Impacting Laminated Glass for Automotive Windscreens
p.72

MLD Method for the Determination of Major Components in MgO-Cr Refractory Products
p.76

Numerical Simulation of Powder Dispersion Performance by Different Mesh Types
p.82

HomeKey Engineering MaterialsKey Engineering Materials Vol. 680Patent Map Analysis of Measurement Technology

Patent Map Analysis of Measurement Technology

Abstract:

According to World Intellectual Property Indicators 2014, growth rate of measurement technique was the leader of the top five fields of technology. Professional tool-ISI Web of Knowledge System Derwent World Patents Index database (DWPI) was used to acquire and study patent data. Thomson's patent analyses software TDA was used in measurement technology patents map analysis, paying attention to the technical focus and hot spots. In this paper, searching patent status of measurement from 2010 to 2014 by using professional tool DWPI and TDA, hot spots of patent application in measurement field were found. Considering multi parameters, such as patent application year, patent application country/region and measurement subdivisions, the development trends and hot spots of world patents of measurement analyzed, several proposals were put forward to improve the quality of China measurement patents.