Preparation of Silicon Carbide Nanowires and Nanochains Using Chemical Vapor Deposition Method

Jia Xing Chang; Rong Zheng Liu; Ma Lin Liu; You Lin Shao; Bing Liu

doi:10.4028/www.scientific.net/KEM.697.841

Paper Titles

Preparation of Li₄SiO₄ Ceramic Pebbles by Agar Method Using Li₂SiO₃ and Li₂CO₃ as Raw Materials
p.814

Preparation and Characterization of Lithium Orthosilicate Ceramic Pebbles by Melt Spraying Method
p.818

Characterization of the Tracer YSZ/CoO Microspheres with YSZ Ceramic Coating for HTR Fuel Element
p.822

Processing and Thermal Properties of Multiwall Carbon Nanotube/Bismuth Antimony Telluride Composites for Nuclear Energy Applications
p.826

Preparation of UCO Microspheres by Internal Gelation Process
p.831

Preparation and Performance of Fully Ceramic Fuel Element Using Silicon Carbide as Coating Layers
p.835

Preparation of Silicon Carbide Nanowires and Nanochains Using Chemical Vapor Deposition Method
p.841

Preparation of Silicon Carbide Coating Layer by Fluidized Bed Chemical Vapor Deposition Using a Halogen-Free Precursor
p.846

Effect of PyC Thermal Behavior on the Stress of TRISO-Coated Fuel Particles
p.852

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Preparation of Silicon Carbide Nanowires and Nanochains Using Chemical Vapor Deposition Method

Abstract:

Silicon carbide nanowires have been extensively studied because of their unique physical and chemical properties. They can be applied in high temperature, high frequency, high power, and corrosive environments, and have a wide range of applications in electronics, chemical industry, energy and other fields. In this paper, SiC nanowires with high output were synthesized by chemical vapor deposition method using methyltrichlorosilane as raw material. The influences of the catalyst and temperature were studied. SiC nanochains were also obtained by adding Al₂O₃ powder under appropriate temperature controlled strategy. These two kinds of one-dimensional SiC nanomaterials were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive X-ray spectrometer (EDS) and transmission electron microscope (TEM) methods.