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HomeKey Engineering MaterialsKey Engineering Materials Vols. 81-83Amorphous Bimetal Interface as a Testing Medium...

Amorphous Bimetal Interface as a Testing Medium for Spatial Resolution of EDX Microanalysis

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Amorphous Metallic Materials III

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Periodical:

Key Engineering Materials (Volumes 81-83)

Pages:

601-606

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.81-83.601

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Online since:

January 1993

Authors:

Kornel Csach, Václav Ocelík, J. Miskuf, P. Duhaj

Keywords:

Amorphous Bilayer, EDX Microanalysis, Metallic Glass

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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