Amorphous Bimetal Interface as a Testing Medium for Spatial Resolution of EDX Microanalysis

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Periodical:

Key Engineering Materials (Volumes 81-83)

Edited by:

P. Duhaj, P. Mrafko and P. Svec

Pages:

601-606

DOI:

10.4028/www.scientific.net/KEM.81-83.601

Citation:

K. Csach et al., "Amorphous Bimetal Interface as a Testing Medium for Spatial Resolution of EDX Microanalysis", Key Engineering Materials, Vols. 81-83, pp. 601-606, 1993

Online since:

January 1993

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$35.00

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