Microstructure Investigation of He⁺- Implanted and Post-Implantation-Annealed 4H-SiC

Abstract:

Microstructure damage and evolution in 4H-SiC under He-ion implantation and post-annealing have been investigated by the combination of fourier transform infrared spectrometer (FTIR), Raman scattering spectroscopy and high resolution X-ray diffractometer (HRXRD). After implantation, the 4H-SiC specimen exhibits a heavy damage and some amorphous state appear. With increasing annealing temperature, to some extent recovery in damaged lattices was observed, as a result of the peaks of Raman and HRXRD regain their intensities. However, the reverse annealing behavior in damaged peaks was displayed after annealed at 973K. This reverse annealing effect was revealed to be due to the formation and the growth of He bubbles above 973K.

• Periodical: Key Engineering Materials (Volume 814)
• Pages: 302-306
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.814.302
• Online since: July 2019
• Authors: Li Qing Zhang*, Hui Ping Liu, Long Kang, Tong Min Zhang, Yu Guang Chen, Xian Long Zhang, Zhao Nan Ding, Jian Yang Li, Juan Liu, Jin Yu Li, Chong Hong Zhang
• Keywords: Annealing, FTIR, He-Ion Implantation, HRXRD, Raman, SiC

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