Simple and Low-Cost Rotating Analyzer Ellipsometer (RAE) for Wavelength Dependent Optical Constant Characterization of Novel Materials

Abstract:

Simple and low-cost homemade Rotating Analyzer Ellipsometer (RAE) configuration has been developed. Ellipsometer measures the changes of the reflected light polarization of the sample, yielding to the ratio of amplitude (ψ) and phase difference (Δ) between p- and s-polarization. Based on the ψ and Δ values, the dielectric constant of the sample can be extracted. However, the available manufacturer-made ellipsometer is quite expensive and is not a good choice for the student to learn the optical concept since the complexity of its structure could hide the simple optical concept during the measurement. In this work, we have built RAE that constituted of relatively simple components and low-cost as well as simple configuration. Here, we also show the principle of measurement and the ellipsometry data analysis using the optical model related to the system under study Drude-Lorentz model. The calibration of our SE has been done by measuring standard materials in the energy range of 1.5 to 3.3 eV and it was compared to the reference measurement using standard ellipsometer. The result is surprisingly accurate within the error of 5%. This research can be used for studying the several important optical concepts as well as for investigating nanostructured materials.

• Periodical: Key Engineering Materials (Volume 840)
• Pages: 392-398
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.840.392
• Online since: April 2020
• Authors: Asmida Herawati, Riza Ariyani Nur Khasanah, Lucky Zaehir Maulana, Edi Suharyadi, Iman Santoso*
• Keywords: Au Bulk, Light Polarization, Optical Constant, Quartz, Rotating Analyzer Ellipsometer

References

[1] Q. Zhang, E. Uchaker,  S. L. Candelaria ,  G. Cao, Nanomaterials for energy conversion and storage, Chem. Soc. Rev. 42 (2013) 3127-3171.

DOI: 10.1039/c3cs00009e

[2] Y. Li, F. Qian, J. Xiang, C. M. Lieber, Nanowire electronic and optoelectronic devices, Mater. Today 9 (2006) 18-27.

DOI: 10.1016/s1369-7021(06)71650-9

[3] T.M. El-Agez, S.A. Taya, Development and construction of rotating polarizer analyzer ellipsometer, Opt. Laser. Eng. 49 (2011) 507-513.

DOI: 10.1016/j.optlaseng.2011.01.005

[4] R.S. Moirangthem, Y.C. Chang, P. K. Wei, Ellipsometry study on gold-nanoparticle-coated gold thin film for biosensing application, Biomed. Opt. Express. 2 (2011) 2569-2576.

DOI: 10.1364/boe.2.002569

[5] A.G. Al-Rubaye, A. Nabok, A. Tsargorodska, Spectroscopic ellipsometry study of gold nanostructures for LSPR bio-sensing applications, Sensing and Bio-Sensing Research 12 (2017) 30-35.

DOI: 10.1016/j.sbsr.2016.11.006

[6] H. Fujiwara, Spectroscopic Ellipsometry Principles and Applications, John Wiley and Sons Ltd., West Sussex, (2007).

[7] K. Hassani, K. Abbaszadeh, Thin film characterization with a simple stokes ellipsometer, Eur. J. Phys. 36 (2015) 1-10.

DOI: 10.1088/0143-0807/36/2/025017

[8] L.Z. Maulana, K Megasari, E Suharyadi, R Anugraha, K Abraha, I. Santoso, Inexpensive home-made single wavelength ellipsometer (λ=633 nm) for measuring the optical constant of nanostructured materials, IOP Conf. Series 202 (2017) 1-8.

DOI: 10.1088/1757-899x/202/1/012031

[9] K.M. Mc Peak, S.V. Jayanti, S.J.P. Kress, S. Meyer, S. Iotti, A. Rossinelli, D.J. Norris, Plasmonic films can easily be better: rules and recipes, ACS Photonics 2 (2015) 326-333.

DOI: 10.1021/ph5004237

[10] P.B. Johnson, R.W. Christy, Optical constants of the noble metals, Phys. Rev. B 6 (1972) 4370-4379.

DOI: 10.1103/physrevb.6.4370