X-Ray Powder Diffraction Data and Crystal Refinement of Ternary Compound Ti4ZrSi3

Liu Qing Liang; Yan Ying Wei; De Gui Li

doi:10.4028/www.scientific.net/KEM.841.99

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HomeKey Engineering MaterialsKey Engineering Materials Vol. 841X-Ray Powder Diffraction Data and Crystal...

X-Ray Powder Diffraction Data and Crystal Refinement of Ternary Compound Ti₄ZrSi₃

Abstract:

Ternary compound Ti₄ZrSi₃ was prepared by arc melting using a non-consumable tungsten electrode under argon atmosphere, then annealed at 1023K for 30 days, the X-ray powder diffraction data of Ti₄ZrSi₃was collected on a Rigaku SmartLab X-ray powder diffractometer. The powder patterns of the compound were indexed and structure refinement by using Rietveld method indicate that the Ti₄ZrSi₃compound crystallizes in the hexagonal structure, space group P6/mcm (No.193) with Mn₅Si₃structure type, a=b=7.5759(3) Ǻ, c=5.2162(2) Ǻ, V=259.28Ǻ³, Z=2, ρ_x=4.779g cm^-3, the Smith–Snyder FOM F₃₀=148.7(0.0064, 46) and the intensity ratio RIR=1.37. The Rietveld refinement results were R_p = 0.0836, R_wp= 0.1092.

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Periodical:

Key Engineering Materials (Volume 841)

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99-102

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.841.99

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Online since:

May 2020

Authors:

Liu Qing Liang*, Yan Ying Wei, De Gui Li

Keywords:

Structure Refinement, Ti₄ZrSi₃, X-Ray Powder Diffraction

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