Atomic Force Microscopy of the Local Electrical Properties of Bilayer Polyaniline-Polystyrene/P(VDF-TrFE) Composite

Abstract:

Atomic force microscopy techniques (conductive-AFM, I-V spectroscopy and PFM) were used for characterisation of the local electrical properties of bilayer polyaniline-polystyrene/P(VDF-TrFE) polymer nanocomposite. Observed hysteresis of current-voltage characteristics confirms its memristive properties. It was caused by the influence of the ferroelectric polarization of P(VDF-TrFE) layer, the domain structure of which was visualised by piezoelectric force microscopy on the transport of charge carriers at the interface.

• Periodical: Key Engineering Materials (Volume 899)
• Pages: 506-511
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.899.506
• Online since: September 2021
• Authors: Artem V. Budaev*, Ivanna N. Melnikovich, Vasily E. Melnichenko, Nikita A. Emelianov
• Keywords: Conductive-AFM, Current-Voltage Characteristics, Domain Structure, P(VDF-TrFE), Piezoresponse Force Microscopy, Polyaniline

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