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HomeKey Engineering MaterialsKey Engineering Materials Vols. 99-100Scanning Probe Microscopies-Applications in...

Scanning Probe Microscopies-Applications in Material Science

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Advances in Engineering Materials

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Periodical:

Key Engineering Materials (Volumes 99-100)

Pages:

161-168

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.99-100.161

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Online since:

March 1995

Authors:

Norman M.D. Brown

Keywords:

Atomic Force Microscope (AFM), Scanning Tunneling Microscopy, STM

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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