Optimize the Operational Efficiency and Performance of Resistive Photomemory by Adjusting the Molecular Chain Ratio in the Polyimide Film

Article Preview

Abstract:

The current research focus in our group is on utilizing the polymer material polyimide (PI) as the resistance switching layer for resistive memory. In recent years, PI resistive photomemory (RePM) [1] has been developed, capitalizing on the photosensitive properties of PI films in the ultraviolet light band. PI initially possesses two chemical structures, Aromatic and Quinoid, the PI film undergoes transformation when exposed to ultraviolet light. By employing various processing methods to control the ratio of Quinoid and Aromatic molecular chains in the PI film, and through FTIR measurements of chemical structure changes before and after illumination, we gain insights into the variations in the molecular chain ratio due to different experimental parameters. FTIR analysis reveals that changes in spin coating speed influence the molecular ratio within the film, attributed to differences in molecular chain shapes and lengths. Experimental results demonstrate that optimizing the spin coating process enhances the operational efficiency of RePM, significantly extending data retention time.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volume 1126)

Pages:

3-9

Citation:

Online since:

September 2024

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2024 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] S. Munjal and N. Khare, "Advances in resistive switching-based memory devices," Journal of Physics D: Applied Physics, vol. 52, no. 43, p.433002, 2019.

DOI: 10.1088/1361-6463/ab2e9e

Google Scholar

[2] Mao, D., Lv, G., Gao, G., & Fan, B. (2019). Fabrication of polyimide films with imaging quality using a spin-coating method for potential optical applications. Journal of Polymer Engineering, 39(10), 917-925.

DOI: 10.1515/polyeng-2019-0177

Google Scholar

[3] Hsiao, Y. P., Yang, W. L., Wu, C. C., Lin, L. M., Chin, F. T., Lin, Y. H., & Yang, K. L. (2015). Improving high-resistance state uniformity and leakage current for polyimide-based resistive switching memory by rubbing post-treatment. Japanese Journal of Applied Physics, 55(1S), 01AA09.

DOI: 10.7567/jjap.55.01aa09

Google Scholar

[4] C. -C. Wu, W. -F. Wu, G. -W. Lin and W. -L. Yang, "Effects of the Molecular Chain Length of Polyimide on the Characteristics of Organic Resistive Random-Access Memories," in IEEE Transactions on Electron Devices, vol. 67, no. 1, pp.277-282, Jan. 2020.

DOI: 10.1109/TED.2019.2952361

Google Scholar

[5] C. Ş, V. Musteata, I. Sava, and M. Bruma, "Study of dielectric behavior of aromatic polyimide films," in CAS 2010 Proceedings (International Semiconductor Conference), 11-13 Oct. 2010 2010, vol. 02, pp.325-328.

DOI: 10.1109/SMICND.2010.5650686

Google Scholar

[6] WU, Chi-Chang; CHEN JR, Tsung; YANG, Wen-Luh. Polyimide-based ultraviolet-operated nonvolatile photomemory device. Applied Physics Letters, 2022, 121.21.

DOI: 10.1063/5.0127937

Google Scholar

[7] Tang-Yi Liu, "Impact of UV illumination on molecular structure of Polyimide and their application in photo-operation Resistive Random-Access Memories". Master, ECE, FCU, Taichung, 2022. Available: https://hdl.handle.net/11296/9x35ha

Google Scholar

[8] KOTSUKI, Kenji, et al. The importance of spinning speed in fabrication of spin-coated organic thin film transistors: Film morphology and field effect mobility. Applied Physics Letters, 2014, 104.23.

DOI: 10.1063/1.4883216

Google Scholar

[9] Wang, Q., Juarez-Perez, E. J., Jiang, S., Qiu, L., Ono, L. K., Sasaki, T., ... & Li, Y. (2018). Spin-coated crystalline molecular monolayers for performance enhancement in organic field-effect transistors. The Journal of Physical Chemistry Letters, 9(6), 1318-1323.

DOI: 10.1021/acs.jpclett.8b00352

Google Scholar

[10] DeLongchamp, Dean M., et al. "Variations in semiconducting polymer microstructure and hole mobility with spin-coating speed." Chemistry of materials 17.23 (2005): 5610-5612

DOI: 10.1021/cm0513637

Google Scholar