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Optical and Structural Microstriation of Sapphire Grown by Different Methods

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Abstract:

The conditions and mechanisms of the formation of structural microstriations and their effect on the optical uniformity of undoped and doped sapphire grown by various melt methods were investigated. It was found that the striations are mainly oriented parallel to the (0001) plane and their formation do not depend on the distribution or concentration of the dopant nor on the crystallographic direction of crystal growth. The existence of spatially ordered structures in crystals, which are characterized by the formation of periodic macrostriations or "pack" with a thin internal substructure, is shown. It was found that formation of "pack" leads to the optical inhomogeneity (WFD) with an amplitude up to PV ~ λ/4 (~ 633 nm), as well as the splitting of the diffraction reflection curve (reflection <30-30>) >) into several subpeaks, which indicates the presence of polygonal dislocation boundaries with misorientation angles ~1.5''-2.0''.

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Periodical:

Materials Science Forum (Volume 1180)

Pages:

25-32

DOI:

https://doi.org/10.4028/p-dz0fHA

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Online since:

March 2026

Authors:

Serhii I. Kryvonohov*, Oleg A. Lukienko, Natalya S. Sidelnikova, Sergii V. Nizhankovskyi

Keywords:

Optical Homogeneity, Ruby (Cr:Al2O3), Sapphire (Al2O3), Structural Perfection, Ti:Sapphire (Ti:Al2O3)

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© 2026 Trans Tech Publications Ltd. All Rights Reserved

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