Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements

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Periodical:

Materials Science Forum (Volumes 126-128)

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463-466

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Online since:

January 1993

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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