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Phase Transitions and Interfacial Rearrangements at the Surface Film of Adsorbed Hexadecyl-Tributylphosphonium Bromide Studied in a Capacitane-Potential-Time 3-Dimensional Space
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Intergranular Polymeric Boundaries in Cork Aggregate Materials
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Pressure Effect on Grain Boundary Energy and Kinetics
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Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements
p.463
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In Situ High-Resolution Transmission Electron Microscopy of the Amorphous to Crystalline Phase Transformation in Pd80Si20 Alloy
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Application of Numerical Methods to the Analysis of Growth Processes in Diffusion Layers
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Grain Boundary Relaxations in Aluminium Studied in Low Frequency Mechanical Spectroscopy
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High Temperature Behaviour of Yttria-Stabilized Tetragonal Zirconia and Silicon Nitride Polycrystals Studied by Mechanical Spectroscopy
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Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements
Abstract:
Info:
Periodical:
Materials Science Forum (Volumes 126-128)
Edited by:
Ph. Komninou and A. Rocher
Pages:
463-466
DOI:
10.4028/www.scientific.net/MSF.126-128.463
Citation:
P. Gladkov et al., "Characterization of the Interface Ta/GaAs in Schottky Barrier Structures Prepared by Low Energy RF Sputtering with X-Ray Photoemission, TEM and Optical Transmittance Measurements ", Materials Science Forum, Vols. 126-128, pp. 463-466, 1993
Online since:
January 1993
Authors:
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$35.00
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