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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162Stress-Induced Grain Growth in Thin Al-1%Si Layers...

Stress-Induced Grain Growth in Thin Al-1%Si Layers on Si/SiO₂ Substrates

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

1205-1210

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.1205

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Online since:

May 1994

Authors:

D. Gerth, Stefan Zaefferer, Robert A. Schwarzer

Keywords:

Al-1%Si, Electron Diffraction (ED), Grain Growth, Kikuchi Patterns, Local Texture, Strain, Stress, TEM

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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