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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162Microtextural Characterization of Annealed and...

Microtextural Characterization of Annealed and Deformed Copper

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

1313-1318

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.1313

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Online since:

May 1994

Authors:

Stuart I. Wright, F. Heidelbach

Keywords:

Electron Backscatter Diffraction (EBSD), Microtexture, Misorientation Distribution

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Сopyright:

© 1994 Trans Tech Publications Ltd. All Rights Reserved

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