Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations

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Periodical:

Materials Science Forum (Volumes 157-162)

Edited by:

H.J. Bunge

Pages:

1571-1576

DOI:

10.4028/www.scientific.net/MSF.157-162.1571

Citation:

D. Gerth and R. A. Schwarzer, "Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations ", Materials Science Forum, Vols. 157-162, pp. 1571-1576, 1994

Online since:

May 1994

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$35.00

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