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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162Local Mechanical Properties in Thin Aluminium...

Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

1571-1576

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.1571

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Online since:

May 1994

Authors:

D. Gerth, Robert A. Schwarzer

Keywords:

Al-1%Si, Electron Diffraction (ED), Grain Growth, Kikuchi Patterns, Local Texture, Strain, Stress, TEM, Thin Film

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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