Transmission Electron Microscopy Analysis of Grain Boundary Behavior in Superplastic Doped Aluminas

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Periodical:

Materials Science Forum (Volumes 170-172)

Edited by:

Terence G. Langdon

Pages:

409-414

DOI:

10.4028/www.scientific.net/MSF.170-172.409

Citation:

S. Lartigue-Korinek et al., "Transmission Electron Microscopy Analysis of Grain Boundary Behavior in Superplastic Doped Aluminas", Materials Science Forum, Vols. 170-172, pp. 409-414, 1994

Online since:

October 1994

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$35.00

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