Positron Lifetime Measurements of Delta Doped MBE Grown Silicon Structures

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Periodical:

Materials Science Forum (Volumes 175-178)

Edited by:

Yuan-Jin He, Bi-Song Cao and Y.C. Jean

Pages:

213-216

Citation:

J. Störmer et al., "Positron Lifetime Measurements of Delta Doped MBE Grown Silicon Structures", Materials Science Forum, Vols. 175-178, pp. 213-216, 1995

Online since:

November 1994

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Price:

$38.00

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