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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Clustering Process of Point Defects in GaP Studied...

Clustering Process of Point Defects in GaP Studied by Transmission Electron Microscopy

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

1279-1284

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.1279

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Online since:

November 1995

Authors:

Y. Ohno, S. Takeda, Masako Hirata

Keywords:

Defect Migration, GaP, Interstitial Mobility, Interstitial Pair, TEM

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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