Quantitative High-Resolution Electron Microscopy of Interfaces

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Periodical:

Materials Science Forum (Volumes 207-209)

Edited by:

A.C. Ferro, J.P. Conde and M.A. Fortes

Pages:

23-34

DOI:

10.4028/www.scientific.net/MSF.207-209.23

Citation:

F. Ernst et al., "Quantitative High-Resolution Electron Microscopy of Interfaces", Materials Science Forum, Vols. 207-209, pp. 23-34, 1996

Online since:

February 1996

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$35.00

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