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HomeMaterials Science ForumMaterials Science Forum Vols. 207-209Quantitative High-Resolution Electron Microscopy...

Quantitative High-Resolution Electron Microscopy of Interfaces

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Intergranular and Interphase Boundaries in Materials II

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Periodical:

Materials Science Forum (Volumes 207-209)

Pages:

23-34

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.207-209.23

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Online since:

February 1996

Authors:

F. Ernst, Dieter Hofmann, K. Nadarzinski, C. Schmidt, S. Stemmer, S.K. Streiffer

Keywords:

Atomistic Structure, Domain Boundary, Quantitative HRTEM, Twin Boundaries

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Сopyright:

© 1996 Trans Tech Publications Ltd. All Rights Reserved

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