Thermal-Wave Imaging: A Non-Destructive Technique to Characterize the Electromigration on Al Alloy

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 210-213)

Edited by:

Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud

Pages:

309-316

Citation:

A. Brun et al., "Thermal-Wave Imaging: A Non-Destructive Technique to Characterize the Electromigration on Al Alloy", Materials Science Forum, Vols. 210-213, pp. 309-316, 1996

Online since:

May 1996

Export:

Price:

$38.00