Thermal-Wave Imaging: A Non-Destructive Technique to Characterize the Electromigration on Al Alloy

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Periodical:

Materials Science Forum (Volumes 210-213)

Edited by:

Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud

Pages:

309-316

DOI:

10.4028/www.scientific.net/MSF.210-213.309

Citation:

A. Brun et al., "Thermal-Wave Imaging: A Non-Destructive Technique to Characterize the Electromigration on Al Alloy", Materials Science Forum, Vols. 210-213, pp. 309-316, 1996

Online since:

May 1996

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$35.00

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