Nondestructive Morphological Characterization of Latent and Etched Ion Tracks in PETP by SANS

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Periodical:

Materials Science Forum (Volumes 210-213)

Edited by:

Anthony L. Bartos, Robert E. Green, Jr. and Clayton O. Ruud

Pages:

719-726

DOI:

10.4028/www.scientific.net/MSF.210-213.719

Citation:

F. Haeussler et al., "Nondestructive Morphological Characterization of Latent and Etched Ion Tracks in PETP by SANS", Materials Science Forum, Vols. 210-213, pp. 719-726, 1996

Online since:

May 1996

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