Paper Titles

Empirical Texture Correction for Different Diffraction Geometrics: Experimental Tests
p.77

New Opportunities in the Texture and Stress Field by the Whole Pattern Analysis
p.83

Analysis of Peak Shapes in X-Ray Diffractometry (GUINIER Geometry) of Standard Materials Using Asymmetric Profile Functions
p.89

Diffraction Anomalous Fine Structure Analysis on (Bi,Pb)₂PtO₄ Powders
p.95

Rapid Polymer Identification with X-Ray Diffraction
p.101

An Improved X-Ray Image Plate Detector for Diffractometry
p.107

Refinement of Powder Diffraction Data Collected Using Imaging Plates
p.113

X-Ray Imaging Using Fluorescence or Polycrystalline Diffraction
p.119

Stress Analysis Using an Area Detector
p.125

HomeMaterials Science ForumMaterials Science Forum Vols. 228-231Rapid Polymer Identification with X-Ray...

Rapid Polymer Identification with X-Ray Diffraction

Article Preview

Abstract:

You might also be interested in these eBooks

$European Powder Diffraction 4$ View Preview

Info:

Periodical:

Materials Science Forum (Volumes 228-231)

Pages:

101-106

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231.101

Citation:

Cite this paper

Online since:

July 1996

Authors:

S. Haaga, W. Engel, M. Tietz, H.-J. Radusch

Keywords:

Correlation Method, Difference Method, Identification of Polymers, X-Ray Diffraction (XRD)

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1996 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: