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Paper Titles
Preface
Structure Determination from Very Small Crystals
p.3
Analysis of Strain Fields by Means of Diffraction-Line Broadening
p.11
Application of the Smooth Genetic Algorithm for Indexing Powder Patterns – Tests for the Orthorhombic System
p.19
A Criterion for Correct Indexing of Powder Diffraction Diagrams Based on Preferred Orientation (Texture)
p.25
Rietveld Refinement Using Debye-Scherrer Film Techniques
p.29
Integration of Intensity and Angle Calibration into Rietveld Refinement
p.35
Ab Initio Calculations of Diffraction Patterns of Submicron Powders
p.39
Addition Method in the Quantitative Analysis: Dependence of Error on the Quantity of Additive
p.43

Analysis of Strain Fields by Means of Diffraction-Line Broadening

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Periodical:

Materials Science Forum (Volumes 228-231)

Pages:

11-18

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231.11

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Online since:

July 1996

Authors:

J.G.M. Van Berkum, Rob Delhez, T.H. de Keijser, Eric Jan Mittemeijer

Keywords:

Lattice Defect, Line Broadening, Modeling, Strain

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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